Sefer, AhmetYapar, AliBağcı, Hakan2023-10-172023-10-172023-07Sefer, A., Yapar, A. & Bağcı, H. (2023). Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method. Paper presented at the IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), 2023-07, 467-468. doi:10.1109/USNC-URSI52151.2023.102377959781665442282978166544227597816654422991947-14911522-3965https://hdl.handle.net/11729/5769http://dx.doi.org/10.1109/USNC-URSI52151.2023.10237795An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are “measured” along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.eninfo:eu-repo/semantics/closedAccessElectromagnetic imagingInverse electromagnetic scatteringReverse time migrationRough surfaceConference Object2023-074674382-s2.0-8517241194710.1109/USNC-URSI52151.2023.10237795N/A