Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method
Yükleniyor...
Tarih
2023-07
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
IEEE
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
An electromagnetic imaging scheme, which makes use of a single-frequency reverse time migration (RTM) technique to reconstruct two-dimensional (2D) rough surface profiles from the scattered field data, is formulated and implemented. The unknown surface profile, which is expressed as a one-dimensional height function, is the interface between two dielectric media. It is assumed that the profile is illuminated from one side and the scattered fields are “measured” along a line on this same side. RTM is used to construct a cross-correlation imaging functional that is numerically evaluated to yield an image of the investigation domain. The maxima of this functional yields an accurate reconstruction of the rough dielectric surface profile.
Açıklama
Anahtar Kelimeler
Electromagnetic imaging, Inverse electromagnetic scattering, Reverse time migration, Rough surface
Kaynak
IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
WoS Q Değeri
Scopus Q Değeri
N/A
Cilt
2023-07
Sayı
Künye
Sefer, A., Yapar, A. & Bağcı, H. (2023). Electromagnetic imaging of rough dielectric surface profiles using a single-frequency reverse time migration method. Paper presented at the IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), 2023-07, 467-468. doi:10.1109/USNC-URSI52151.2023.10237795
