A new software tool to model measured RF-data with optimum circuit topology

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dc.authorid0000-0003-1562-5524
dc.authorid0000-0001-7937-8580
dc.authorid0000-0002-3412-5077
dc.contributor.authorYarman, Bekir Sıddık Binboğaen_US
dc.contributor.authorKılınç, Alien_US
dc.contributor.authorAksen, Ahmeten_US
dc.date.accessioned2015-07-14T23:48:26Z
dc.date.available2015-07-14T23:48:26Z
dc.date.issued2004
dc.departmentIşık Üniversitesi, Mühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.departmentIşık University, Faculty of Engineering, Department of Electrical-Electronics Engineeringen_US
dc.description.abstractIn this paper a new S/W tool is presented to model measured RF data employing immitance interpolation techniques. This S/W tool also employs a recently developed sub-routine, which generates circuit models with least number of circuit elements by means of a novel numerical approach. Furthermore, an analytic procedure is introduced and implemented within the new S/W package to select proper sample-points subject to interpolation which in turn controls the interpolation error in the "near min-max sense" or the so-called "Chebyshev Sense". Hence, the optimum circuit topology for the given data is constructed. An example is presented to exhibit the utilization of the new tool. This new S/W package may be utilized as the front end to the commercially available Design and Analysis Packages such as ANSOFT, EAGELWARE etc.en_US
dc.description.sponsorshipInstitute of Electrical and Electronics Engineers, IEEEen_US
dc.description.sponsorshipIEEE Cirquits and Systems Societyen_US
dc.description.versionPublisher's Versionen_US
dc.identifier.citationYarman, B. S. B., Kılınç, A. & Aksen, A. (2004). A new software tool to model measured RF-data with optimum circuit topology. Paper presented at the 2004 IEEE International Symposium on Circuits and Systems, 980-983. doi:10.1109/ISCAS.2004.1328361en_US
dc.identifier.doi10.1109/ISCAS.2004.1328361
dc.identifier.endpage983
dc.identifier.isbn078038251X
dc.identifier.scopus2-s2.0-4344599465
dc.identifier.scopusqualityN/A
dc.identifier.startpage980
dc.identifier.urihttps://hdl.handle.net/11729/661
dc.identifier.urihttp://dx.doi.org/10.1109/ISCAS.2004.1328361
dc.identifier.wosWOS:000223122300246
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakConference Proceedings Citation Index – Science (CPCI-S)en_US
dc.institutionauthorYarman, Bekir Sıddık Binboğaen_US
dc.institutionauthorKılınç, Alien_US
dc.institutionauthorAksen, Ahmeten_US
dc.institutionauthorid0000-0003-1562-5524
dc.institutionauthorid0000-0001-7937-8580
dc.institutionauthorid0000-0002-3412-5077
dc.language.isoenen_US
dc.peerreviewedYesen_US
dc.publicationstatusPublisheden_US
dc.publisherIEEEen_US
dc.relation.ispartof2004 IEEE International Symposium on Circuits and Systemsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCircuit topologyen_US
dc.subjectCurve fittingen_US
dc.subjectError correctionen_US
dc.subjectFiltering theoryen_US
dc.subjectInterpolationen_US
dc.subjectPackagingen_US
dc.subjectPolynomialsen_US
dc.subjectRadio frequencyen_US
dc.subjectSoftware measurementen_US
dc.subjectSoftware toolsen_US
dc.subjectAnsoften_US
dc.subjectChebysev senseen_US
dc.subjectEaglewareen_US
dc.subjectRF-Dataen_US
dc.subjectCircuit elementsen_US
dc.subjectCircuit modelsen_US
dc.subjectImmitance interpolationen_US
dc.subjectInterpolation erroren_US
dc.subjectNear min-max caseen_US
dc.subjectNumerical approachen_US
dc.subjectSample-points subjecten_US
dc.subjectCircuit analysis computingen_US
dc.subjectElectric immittanceen_US
dc.subjectIntegrated circuit modellingen_US
dc.subjectChebyshev approximationen_US
dc.subjectComputer softwareen_US
dc.subjectData reductionen_US
dc.subjectFinite element methoden_US
dc.subjectFunctionsen_US
dc.subjectMathematical modelsen_US
dc.subjectTopologyen_US
dc.subjectFinite zerosen_US
dc.subjectOptimum circuit topologyen_US
dc.subjectRational functionsen_US
dc.subjectIntegrated circuitsen_US
dc.titleA new software tool to model measured RF-data with optimum circuit topologyen_US
dc.typeConference Objecten_US
dspace.entity.typePublication

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